This paper reviews the existing knowledge base about thermal contact resistance in cooling electronic equipment, and also highlights some novel issues that are emerging with the advent of compact electronic equipment. Where a high contact pressure is tolerable, such as in cooling power electronic devices, the experimental data and the theoretical models that have been developed to this day provide useful guides for the management of contact resistance. In such applications the compression load and a technique to enhance interface heat transfer need be examined, weighing their relative importance in the entire heat transfer system. Using the Yovanovich correlation for contact resistance and assuming water-cooled or air-cooled heat sinks, the contact pressure ranges of practical importance are identified. The case studies revealed that contact pressures around and less than 1–4 MPa are often sufficient to make the contact conductance comparable to the convective conductance in the water-cooled channel. The threshold pressure is much lower for the air-cooled case, around 0.2–0.6 MPa. However, heat transfer data in such intermediate pressure ranges are relatively few. For compact electronic equipment, such as laptop computers, the contact conductance to a thin heat spreader plate is becoming an issue of prime importance. In a constrained space the heat flow across the interface is affected by the heat conduction paths beyond the interface. This is illustrated using an example where warped heat sources are in contact with a heat spreader. It is shown that, with decreasing heat spreader thickness, the warping of the heat source has an increasing influence on the contact resistance.
Skip Nav Destination
Article navigation
June 2003
Technical Papers
Thermal Interfacing Techniques for Electronic Equipment—A Perspective
Wataru Nakayama,
Wataru Nakayama
Department of Mechanical Engineering, University of Maryland, College Park, MD 20742
11
Search for other works by this author on:
Arthur E. Bergles
Arthur E. Bergles
Department of Mechanical Engineering, University of Maryland, College Park, MD 20742
Search for other works by this author on:
Wataru Nakayama
11
Department of Mechanical Engineering, University of Maryland, College Park, MD 20742
Arthur E. Bergles
Department of Mechanical Engineering, University of Maryland, College Park, MD 20742
Contributed by the Electronic and Photonic Packaging Division for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received by the EPPD Division June 19, 2001. Guest Editors: Y. Muzychka and R. Culham.
J. Electron. Packag. Jun 2003, 125(2): 192-199 (8 pages)
Published Online: June 10, 2003
Article history
Received:
June 19, 2001
Online:
June 10, 2003
Citation
Nakayama, W., and Bergles, A. E. (June 10, 2003). "Thermal Interfacing Techniques for Electronic Equipment—A Perspective ." ASME. J. Electron. Packag. June 2003; 125(2): 192–199. https://doi.org/10.1115/1.1568127
Download citation file:
Get Email Alerts
Impact of Encapsulated Phase Change Material Additives for Improved Thermal Performance of Silicone Gel Insulation
J. Electron. Packag (December 2024)
Special Issue on InterPACK2023
J. Electron. Packag
Extreme Drop Durability of Sintered Silver Traces Printed With Extrusion and Aerosol Jet Processes
J. Electron. Packag (December 2024)
Related Articles
Foreword
J. Heat Transfer (January,2005)
Surface Chemistry and Characteristics Based Model for the Thermal Contact Resistance of Fluidic Interstitial Thermal Interface Materials
J. Heat Transfer (October,2001)
A Simplified Conduction Based Modeling Scheme for Design Sensitivity Study of Thermal Solution Utilizing Heat Pipe and Vapor Chamber Technology
J. Electron. Packag (September,2003)
Heat Transfer of an IGBT Module Integrated With a Vapor Chamber
J. Electron. Packag (March,2011)
Related Proceedings Papers
Related Chapters
Thermal Interface Resistance
Thermal Management of Microelectronic Equipment
Thermal Interface Resistance
Thermal Management of Microelectronic Equipment, Second Edition
Introduction
Thermal Management of Microelectronic Equipment