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Keywords: microelectronic devices
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Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. March 2019, 141(1): 011002.
Paper No: EP-18-1029
Published Online: February 25, 2019
...Arman Nokhosteen; M. Soltani; Banafsheh Barabadi The high current densities in today's microelectronic devices and microchips lead to hotspot formations and other adverse effects on their performance. Therefore, a computational tool is needed to not only analyze but also accurately predict spatial...