Abstract

This work compared ball grid array (BGA) lead-free solder joint strengths to eutectic lead (Sn–Pb) solder joint strengths under monotonic bend load at room temperature. Flexural test methodologies for evaluating solder joint strength are presented. Various effects on solder joint strength were summarized systematically into three parts. The first part focused on the effect of solder joint geometries. BGAs with Sn-4Ag-0.5Cu and 63Sn-37Pb solders were tested, respectively. The effects of package side solder resist opening sizes, solder ball diameters, and board side metal defined/solder mask defined pads were investigated with 0.062 in printed circuit board (PCB). The results showed that the solder joint strength of Sn–Ag–Cu solder is lower than that of the traditional Sn–Pb solder under room temperature board flexural load and similar dynamic load. The second part investigated the effects of type of package (plastic BGA (PBGA) versus ceramic BGA (CBGA)), board thickness (0.093 in. versus 0.135 in.), and the effect of rework (reworked versus non-reworked) with Sn-3.9Ag-0.7Cu and 63Sn-37Pb solders. The joint strength of Sn–Ag–Cu solder is consistently lower than that of eutectic Sn–Pb solder for both board thicknesses, both CBGA and PBGA packages, and both non-reworked and reworked packages. The third part explored the feasibility of alternative low temperature solders as board-level interconnects. In addition to the traditional 63Sn-37Pb solder and the lead-free Sn-4Ag-0.5Cu solder, four other lead-free solders (Sn-52In, Sn-58Bi, Sn-57Bi-1Ag, and Sn-9Zn-0.006Al) were tested with 0.044 in PCB. Effects of board surface finishes with immersion silver (ImAg) or organic solderability preservatives, and pads with via-in-pad (VIP) or non-VIP pads were investigated. Test results showed that most of the BGAs with non-VIP pads performed better than those with VIP pads, except Sn–In solder with ImAg surface finish. The Sn–In solder showed the lowest performance, while Sn–Bi and Sn–Bi–Ag solder compositions showed better performance. Sn–Zn–Al solder joint strength performs better than others.

References

1.
Geng
,
P.
and
Beltman
,
W. M.
, “
Monitoring Motherboard Shock Response near BGA Solder Joints
,”
Proc. SMTA International Conf.
, Chicago, IL, September
2002
,
SMTA
,
Minnesota
.
2.
Pitarresi
,
J.
,
Geng
,
P.
,
Beltman
,
W. M.
, and
Ling
,
Y.
, “
Dynamic Modeling and Measurement of Personal Computer Motherboard
,”
Proc. 52th Electronic Components and Technology Conf.
, San Diego, CA, May
2002
,
IEEE
,
New Jersey
.
3.
Pitarresi
,
J.
,
Roggeman
,
B.
,
Chaparada
,
S.
, and
Geng
,
P.
, “
Mechanical Shock Testing and Modeling of PC Motherboards
,”
Proc. 54th Electronic Components and Technology Conf.
, Las Vegas, June
2004
,
IEEE
,
New Jersey
.
4.
Geng
,
P.
,
Chen
,
P. H.
, and
Ling
,
Y.
, “
Effect of Strain Rate on Solder Joint Failure Under Mechanical Load
,”
Proc. 52nd Electronic Components and Technology Conf.
, San Diego, CA, May
2002
,
IEEE
,
New Jersey
, pp.
974
978
.
5.
Harada
,
K.
,
Baba
,
S.
,
Wu
,
Q.
,
Matsushima
,
H.
,
Matsunaga
,
T.
,
Uegai
,
Y.
, and
Kimura
,
M.
, “
Analysis of Solder Joint Fracture Under Mechanical Bending Test
,”
Proc. 53th Electronic Components and Technology Conf.
, New Orleans, LA, May
2003
,
IEEE
,
New Jersey
.
6.
Geng
,
P.
, “
Solder Joint Shock Testing and Modeling Methodology Development
,”
IPC Annual Conference, IPC 6-10d Committee Meeting
, Minneapolis, MN, September
2003
,
IPC
,
Illinois
.
7.
Geng
,
P.
,
Beltman
,
W. M.
,
Chen
,
P. H.
,
Daskalakis
,
G.
,
Shia
,
D.
, and
Williams
,
M. H.
, “
Modal Analysis for BGA Shock Test Board and Fixture Design
,”
Proc. Fifth EPTC Conference
, Singapore, December
2003
,
IEEE
,
New Jersey
.
8.
Geng
,
P.
and
Maguire
,
J. F.
, “
Dynamic Testing and Modeling for Solder Joint Reliability Evaluation
,”
Proc. of IPC Technical Conference
, Anaheim, CA, February
2004
,
IPC
,
Illinois
.
9.
Geng
,
P.
,
Modi
,
M.
,
McCormick
,
C.
,
McAllister
,
A.
,
Nazario
,
A.
, and
Williams
,
R.
, “
A Comparative Study of BGA Solder Joint Reliability Under Four-Point Bend and Spherical Bend Tests
,”
Proc. IMAPS International Conf. Electronic Packaging
, Scottsdale, AZ, March
2005
,
IMAPS
,
Washington, D.C.
.
10.
Geng
,
P.
, “
Dynamic Test and Modeling Methodology for BGA Solder Joint Shock Reliability Evaluation
,”
Proc. 55th Electronic Components and Technology Conf.
, Lake Buena Vista, FL, June
2005
,
IEEE
,
New Jersey
.
11.
Geng
,
P.
,
McAllister
,
A.
,
McCormick
,
C.
,
Modi
,
M.
, and
Nazario
,
A.
, “
0.8 mm BGA Solder Joint Strength Under Flexural Load
,”
Proc. SMTA International’04
, Chicago, IL, September
2004
,
SMTA
,
Minnesota
.
12.
Aspandiar
,
R.
,
Geng
,
P.
, and
Armendariz
,
N.
, “
Lead-Free Solder Reliability Under Flexural Load
,” iNEMI Advanced Pb-Free Assembly and Rework Development Project Report, iNEMI, Virginia,
2005
.
13.
NIST Database for Solder Properties with Emphasis on New Lead-Free Solders, Release 4.0, NIST,
2002
, http://www.boulder.nist.gov/div853/lead_free/solders.html (Last accessed June 7, 2010).
14.
Geng
,
P.
,
Aspandiar
,
R.
,
Byrne
,
T.
,
Pon
,
F.
,
Suh
,
D.
,
McAllister
,
A.
,
Nazario
,
A.
,
Paulraj
,
P.
,
Armendariz
,
N.
,
Martin
,
T.
, and
Worley
,
T.
, “
Alternative Lead-Free Solder Joint Integrity Under Room Temperature Mechanical Loads
,”
Proc. Ninth Intersociety Conference on Thermal and Thermal Mechanical Phenomena in Electronic Systems (ITHERM’04)
, Las Vegas, June
2005
,
ASME
,
New York
.
15.
Kim
,
Y. M.
,
Oh
,
C.-Y.
,
Roh
,
H.-R.
, and
Kim
,
Y.-H.
, “
A New Cu–Zn Solder Wetting Layer for Improved Impact Reliability
,”
Proc. 59th Electronic Components and Technology Conf.
, San Diego, CA, June
2009
,
IEEE
,
New Jersey
.
This content is only available via PDF.
You do not currently have access to this content.