Capacitive displacement sensors are widely used in precision manufacturing and metrology because they measure displacements with nanometer resolution. Prior literature usually treats capacitive sensors consisting of electrodes arranged as parallel plates. In this work, the target electrode is spherical, which is common in machine tool metrology, spindle metrology, and the measurement of sphericity. The capacitance due to a gap between flat and spherical electrodes is less than that of two flat electrodes, which causes four effects. As the diameter of the target electrode is reduced, the sensitivity increases, the sensing range decreases, the sensing range shifts toward the target, and the sensor becomes nonlinear. This paper demonstrates and quantifies these effects for a representative capacitive sensor, using finite element analysis and experimental testing. For larger spheres, the effects are correctible with apparent sensitivities, but measurements with the smallest spheres become increasingly nonlinear and inaccurate.
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e-mail: vallance@gwu.edu
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November 2004
Technical Papers
Effects of Spherical Targets on Capacitive Displacement Measurements
R. Ryan Vallance,
e-mail: vallance@gwu.edu
R. Ryan Vallance
Precision Systems Laboratory, The George Washington University, 738 Phillips Hall, 801 22nd St., N.W., Washington, DC 20052
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Eric R. Marsh,
Eric R. Marsh
Machine Dynamics Research Laboratory, The Pennsylvania State University, 21 Reber Building, University Park, PA 16802
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Philip T. Smith
Philip T. Smith
Mechanical Engineering, University of Kentucky, 015 Ralph G. Anderson Building, Lexington, KY 40506
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R. Ryan Vallance
Precision Systems Laboratory, The George Washington University, 738 Phillips Hall, 801 22nd St., N.W., Washington, DC 20052
e-mail: vallance@gwu.edu
Eric R. Marsh
Machine Dynamics Research Laboratory, The Pennsylvania State University, 21 Reber Building, University Park, PA 16802
Philip T. Smith
Mechanical Engineering, University of Kentucky, 015 Ralph G. Anderson Building, Lexington, KY 40506
Contributed by the Manufacturing Engineering Division for publication in the JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING. Manuscript received January 13, 2004; revised April 2, 2004. Associate Editor: T. R. Kurfess.
J. Manuf. Sci. Eng. Nov 2004, 126(4): 822-829 (8 pages)
Published Online: February 4, 2005
Article history
Received:
January 13, 2004
Revised:
April 2, 2004
Online:
February 4, 2005
Citation
Vallance, R. R., Marsh, E. R., and Smith, P. T. (February 4, 2005). "Effects of Spherical Targets on Capacitive Displacement Measurements ." ASME. J. Manuf. Sci. Eng. November 2004; 126(4): 822–829. https://doi.org/10.1115/1.1813476
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